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Services for Business

EMTERC members have a wide range of specialist knowledge and expertise. They are highly skilled and experienced in consultancy work in the following areas:

Surface Analysis

We can provide analysis of surface morphology and electrical or magnetic properties of either prepared samples or real devices (virgin or post use), supported by use of our Park atomic foce microscope (AFM)/scanning probe microscopy (SPM). Characterisation can also take place using our profilometry, ellipsometry and transmission electron microcope facilities

Thin Films

We have extensive clean room facilities for back-end processing, including plasma enhanced chemical vapor deposition (PECVD)/reactive ion etcher (RIE) systems, radio frequency (RF)/direct current (DC) magnetron sputtering, thermal evaporators, dip/spin coating equipment and a Langmuir Blodgett trough for molecular layer deposition and can also provide high quality materials deposited onto a substrate of your choice. Materials covered include metals, semiconductors/insulators and conducting indium tin oxide (ITO).

Electrical Characterisation

We have extensive highly customised measurement facilities for current-voltage and capacitance-voltage measurements of thin film and wafer level packaged devices with high temperature capabilities. Existing set-ups include facilities for solar cell, memory and high power (dynamic and static) Characterisation, and these setups are supported by a number of 8 inch probe stations allowing femto ampere accuracy and high temperature operation (up to 450ºC).

Process and Device Modelling

A wealth of expertise is provided in electrical and electro-thermal device and process modelling, including silicon and III-V technologies, supported by a high performance server network with a synopsis sentaurus TCAD modelling environment.

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